Veröffentlicht am in "Business", Sprache — English. 12 Seiten.
Atomic-force microscopy (AFM) or scanning-force microscopy (SFM) is a type of scanning probe microscopy (SPM), with demonstrated resolution on the order of fractions of a nanometer, more than 1000 times better than the optical diffraction limit.
Buy the complete AFM Probe report with Comprehensive table of contents @ https://goo.gl/dNXuuR Mehr anzeigen
