This report focuses on the Film Thickness Measuring System in United States market, to split the market based on manufacturers, states, type and application. Mais
"Film Thickness Measuring Systems can measure and analysis of single layer and/or multilayer films in less than a second. The optical properties are obtained from reflection and thickness is measured by detecting the sinusoidal fringe pattern from the sample’s specular reflectance.
Thin film measurement instrumentation has evolved from complex, difficult to use systems to today’s compact, practical tools that provide a simple but powerful and flexible interface." Mais