Опубликовано в "Бизнес, Бизнес", язык - English. 5 страниц.
Focused ion beam viz, FIB is a technique used particularly in the semiconductor industry, materials science and increasingly in the biological field. An FIB setup is scientific equipment that looks more like scanning electron microscope (SEM). SEM focuses a beam of electrons to capture the image in chamber whereas FIB uses a focused beam of ions. It can also be assimilated with electrons as well as ion beam columns. FIB systems have been used for long and are coupled with SEM . Еще
